On the reliability assessment of SiC-MOSFETs
On the reliability assessment of SiC-MOSFETs
Location: Faculty Lounge, Elevator C, floor 2, Electrum, Kista Title: On the reliability assessment of SiC-MOSFETs Presenter: Muhammad Nawaz Affiliation: ABB Corporate Research, Västerås, Sweden Abstract High power Semiconductor devices (e.g., MOSFETs, IGBTs and IGCTs) provide basic building blocks for variety of high power applications such as traction, renewable energy generation system, motor drives, and welding... Read more