On the reliability assessment of SiC-MOSFETs
KTH School of ICT Kistagången 16, KistaLocation: Faculty Lounge, Elevator C, floor 2, Electrum, Kista Title: On the reliability assessment of SiC-MOSFETs Presenter: Muhammad Nawaz Affiliation: ABB Corporate Research, Västerås, Sweden Abstract High power Semiconductor devices (e.g.,... Read more