Progress in SiC Power MOSFETs and Elimination of Bipolar Degradation
Progress in SiC Power MOSFETs and Elimination of Bipolar Degradation
Location: Faculty lounge, elevator C, floor 2, Electrum, Kista Tsunenobu Kimoto (Kyoto University) Abstract: SiC has attracted increasing attention as a wide bandgap semiconductor suitable for advanced power devices. In this seminar, progress in 1 kV-class SiC trench MOSFETs and characterization of the MOS interface are presented. 3 kV reverse-blocking SiC MOSFETs toward a bidirectional switch are also demonstrated. In... Read more