HealingAchilles heel of two-dimensional transistors
Stability – in the sense of stable operation thorough lifetime – is one of the key characteristics that an electronic device need to present to be suitable for applications. And it is the Achilles heel of transistors based on two-dimensional materials, which typically show much worse stability than devices based on silicon. A team of… Read more
MQ on “Memristive Devices” and Symposium on Schottky Barrier MOS 2022
The R&D event starts on September 7th with the MQ on “Memristive Devices”. On September 8th the the Symposium of SB-MOS is held. The registration takes place by the vTools of IEEE. The following link is provided: https://meetings.vtools.ieee.org/m/311092 Following lecturers attend the MQ: – Prof. M. Lanza (KAUST, Saudi Arabia) – Prof. E. Miranda (Universitat… Read more
Successful Jamal Deen DL on “Smart Sensors and Smart Homes for Ubiquitous-Healthcare – AI is a Key Enabler”
We are delighted to report on the distinguished lecture from the EDS Germany Chapter that took place on April 22, 2022. The lecture was organized by the EDS Germany Chapter and co-sponsored by the NanoP from THM – University of Applied Sciences. There were numerous IEEE participants and many non IEEE members who attended the lecture…. Read more
Electronics for impossible environments – a workshop
AMO is co-organizing an exciting workshop together with the University of Bristol, within the framework of the ZeroAMP project. The workshop will take place on June 30, 2022, at Clifton Hill House in Bristol, and it will showcase the novel technology developedwithin the ZeroAMP project,as well as insightful talks by external speakers. The goal of… Read more
Workshop “The Future of Computing and Storage”
We would like to invite you to our free Workshop “The Future of Computing and Storage” co- organised on May 17, 2022 in Udine, Italy, by IRDS and the SINANO Institute supported by IEEE-EDS and ASCENT+. It will be devoted to the update of the European contribution to the IRDS Roadmap in the field of Cryogenic… Read more